Test Design
IP Embodiments
ASIC Infrastructure (Libraries, I/Os, Fabrics)
Complex Design IP of Various Forms (Analog and Digital Cores, Memories)
Semiconductor-Based End Product

Test Various
Aspects of the Design
Feature Validation
Parametric Characterization such as I/O Timings, Power, Performance, Jitter,
     Standby Current
Intellectual Property Characterization across Process, Temperature, and Voltage Corners

Develop the Infrastructure
Required to Achieve Testing Goals
Performance Test Chips with Embedded
Characterization Structures
Test Boards for Functional Validation and Characterization