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ASIC Infrastructure (Libraries, I/Os, Fabrics)
Complex Design IP of Various Forms (Analog and Digital Cores, Memories)
Semiconductor-Based End Product
Feature Validation
Parametric Characterization such as I/O Timings, Power, Performance, Jitter,
Standby Current
Intellectual Property Characterization across Process, Temperature, and Voltage Corners
Performance Test Chips with Embedded
Characterization Structures
Test Boards for Functional Validation and Characterization

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