We use a National Instrument platform coupled with bench top test equipment for our Characterization services. We will fully characterize and test IP across all process, voltage, and temperature corners. Starting with a characterization plan, we will develop an automated test flow using National Instrument’s LabVIEW systems engineering software. We will also work with you to create a test plan if one is not available to ensure your test goals are achieved.
For data intensive testing, you can opt for wafer probing on a Cascade Microtech ELITE 300 wafer prober. The advantage of wafer level testing is the ability to accumulate large amounts of data in a shorter time frame as well as more accurate results, as packaging parasitic effects are eliminated. If packaging is required post wafer testing, we can leverage our relationship with QuikPak and arrange for packaging which will meet the module testing requirements.
ASIC North utilizes the Applicos ATX7006A Data Converter Test System, with sample rates from DC up to 200/400MHz, to perform comprehensive data converter analysis. This system is a fully integrated modular solution combining high accuracy, low noise and fast sampling rates. The ATView Analysis software is used for configuring, programming and controlling the ATX7006A as well as eliminating the need for any code development. This allows for quick bring-up and analysis of results which greatly reduces development test time and ultimately the cost to our customers.
