asicNorth CharacterizationTest Design

  • IP Embodiments
  • ASIC Infrastructure (Libraries, I/Os, Fabrics)
  • Complex Design IP of Various Forms (Analog and Digital Cores, Memories)
  • Semiconductor-Based End Product

Test Various

  • Aspects of the Design
  • Feature Validation
  • Parametric Characterization such as I/O Timings, Power, Performance, Jitter, Standby Current
  • Intellectual Property Characterization across Process, Temperature, and Voltage Corners

Develop the Infrastructure

  • Required to Achieve Testing Goals
  • Performance Test Chips with Embedded
  • Characterization Structures
  • Test Boards for Functional Validation and Characterization