Characterization

Test Design

• IP Embodiments
• ASIC Infrastructure (Libraries, I/Os, Fabrics)
• Complex Design IP of Various Forms (Analog and Digital Cores, Memories)
• Semiconductor-Based End Product

Test Various

• Aspects of the Design
• Feature Validation
• Parametric Characterization such as I/O Timings, Power, Performance, Jitter, Standby Current
• Intellectual Property Characterization across Process, Temperature, and Voltage Corners

Develop the Infrastructure

• Required to Achieve Testing Goals
• Performance Test Chips with Embedded
• Characterization Structures
• Test Boards for Functional Validation and Characterization