Characterization
Test Design
- IP Embodiments
- ASIC Infrastructure (Libraries, I/Os, Fabrics)
- Complex Design IP of Various Forms (Analog and Digital Cores, Memories)
- Semiconductor-Based End Product
Test Various
- Aspects of the Design
- Feature Validation
- Parametric Characterization such as I/O Timings, Power, Performance, Jitter, Standby Current
- Intellectual Property Characterization across Process, Temperature, and Voltage Corners
Develop the Infrastructure
- Required to Achieve Testing Goals
- Performance Test Chips with Embedded
- Characterization Structures
- Test Boards for Functional Validation and Characterization